Invention Grant
- Patent Title: Diagnostic circuit and method of testing a circuit
- Patent Title (中): 诊断电路和电路测试方法
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Application No.: US13166299Application Date: 2011-06-22
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Publication No.: US08686737B2Publication Date: 2014-04-01
- Inventor: Jochen Aicher , Robert J. Alvord , James W. Kopec , Vu T. Nguyen
- Applicant: Jochen Aicher , Robert J. Alvord , James W. Kopec , Vu T. Nguyen
- Applicant Address: DE Wangen
- Assignee: Diehl AKO Stiftung & Co. KG
- Current Assignee: Diehl AKO Stiftung & Co. KG
- Current Assignee Address: DE Wangen
- Agent Laurence A. Greenberg; Werner H. Stemer; Ralph E. Locher
- Main IPC: G01R31/02
- IPC: G01R31/02 ; G01R31/08

Abstract:
A diagnostic circuit is configured for connecting to a unit under test that has a load and a sinusoidal source. The diagnostic circuit includes a voltage sensing device that has an input for sensing a signal, a first terminal for connecting to the load, a second terminal for connecting to the sinusoidal source, and a relay connected between the first and second terminals for connecting the sinusoidal source to the load. Clamping diodes are provide for clamping a sinusoidal signal and include a first clamping diode connected between a D/C voltage source and the input and a second clamping diode connected between ground and the input. A resistor is connected between the D/C voltage source and the first terminal. The diagnostic circuit verifies the operational functionality of the load, related wiring and connections.
Public/Granted literature
- US20110248722A1 Diagnostic Circuit and Method of Testing a Circuit Public/Granted day:2011-10-13
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