Invention Grant
- Patent Title: Fundus analyzing appartus and fundus analyzing method
- Patent Title (中): 眼底分析和眼底分析方法
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Application No.: US13387497Application Date: 2010-07-14
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Publication No.: US08684528B2Publication Date: 2014-04-01
- Inventor: Takashi Fujimura , Hiroyuki Aoki
- Applicant: Takashi Fujimura , Hiroyuki Aoki
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Topcon
- Current Assignee: Kabushiki Kaisha Topcon
- Current Assignee Address: JP Tokyo
- Agency: Pearne & Gordon LLP
- Priority: JP2009-177420 20090730
- International Application: PCT/JP2010/004581 WO 20100714
- International Announcement: WO2011/013315 WO 20110203
- Main IPC: A61B3/12
- IPC: A61B3/12 ; A61B3/10

Abstract:
A fundus analyzing apparatus 1 performs OCT measurements of a fundus Ef and generates multiple tomographic images that each depict layer structures of the fundus Ef. Each formed tomographic image is stored in a storage 212. Based on the pixel values of the pixels of each tomographic image, the layer-region identifying part 233 identifies the layer region corresponding to the pigment layer of the retina. Based on the shape of the layer region, the curve calculator 234 obtains a convex standard curve in the direction of depth of the fundus Ef. Based on the layer region and the standard curve, a protrusion-region identifying part 235 identifies protrusion regions where the layer region protrudes in the opposite direction from the direction of depth of the fundus Ef. A morphological-information generating part 236 generates morphological information representing the morphology (number, size, distribution, etc.) of the protrusion regions.
Public/Granted literature
- US20120120368A1 FUNDUS ANALYZING APPARTUS AND FUNDUS ANALYZING METHOD Public/Granted day:2012-05-17
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