Invention Grant
- Patent Title: Apparatus abnormality diagnosis method and system
- Patent Title (中): 仪器异常诊断方法及系统
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Application No.: US13130059Application Date: 2009-11-17
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Publication No.: US08676553B2Publication Date: 2014-03-18
- Inventor: Toshiharu Miwa , Kenji Tamaki
- Applicant: Toshiharu Miwa , Kenji Tamaki
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Antonell, Terry, Stout & Kraus, LLP.
- Priority: JP2008-295111 20081119
- International Application: PCT/JP2009/069482 WO 20091117
- International Announcement: WO2010/058765 WO 20100527
- Main IPC: G06F7/60
- IPC: G06F7/60 ; G06G7/48 ; G06F11/00

Abstract:
A technique relating to an apparatus abnormality diagnosis system, capable of easily creating and adding/updating an diagnosis model with respect to an initial and new failure case, and appropriately and efficiently achieving diagnosis of abnormality and instruction of operation using the model. In the abnormality diagnosis system, an diagnosis model creating process unit creates a structured abnormality model expressing a structured abnormality of maintenance operation type to an alarm and apparatus event relating to the maintenance operation type by a graph network structure based on acquisition of maintenance operation data. And, by synthesizing the structured abnormality model with an existing structured abnormality model, the diagnosis model is updated.
Public/Granted literature
- US20110264424A1 APPARATUS ABNORMALITY DIAGNOSIS METHOD AND SYSTEM Public/Granted day:2011-10-27
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