Invention Grant
US08676538B2 Adjusting weighting of a parameter relating to fault detection based on a detected fault
有权
根据检测到的故障调整与故障检测有关的参数的权重
- Patent Title: Adjusting weighting of a parameter relating to fault detection based on a detected fault
- Patent Title (中): 根据检测到的故障调整与故障检测有关的参数的权重
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Application No.: US10979309Application Date: 2004-11-02
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Publication No.: US08676538B2Publication Date: 2014-03-18
- Inventor: Matthew A. Purdy
- Applicant: Matthew A. Purdy
- Applicant Address: US CA Sunnyvale
- Assignee: Advanced Micro Devices, Inc.
- Current Assignee: Advanced Micro Devices, Inc.
- Current Assignee Address: US CA Sunnyvale
- Main IPC: G06F11/30
- IPC: G06F11/30 ; G06F17/40 ; G06F19/00 ; B23Q17/00
Abstract:
A method, apparatus and a system, for provided for performing a dynamic weighting technique for performing fault detection. The method comprises processing a workpiece and performing a fault detection analysis relating to the processing of the workpiece. The method further comprises determining a relationship of a parameter relating to the fault detection analysis to a detected fault and adjusting a weighting associated with the parameter based upon the relationship of the parameter to the detected fault.
Public/Granted literature
- US20060095232A1 Fault detection through feedback Public/Granted day:2006-05-04
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