Invention Grant
- Patent Title: Media defect classification
- Patent Title (中): 介质缺陷分类
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Application No.: US13525194Application Date: 2012-06-15
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Publication No.: US08675297B2Publication Date: 2014-03-18
- Inventor: Bruce Wilson , Ming Jin , Scott Dziak
- Applicant: Bruce Wilson , Ming Jin , Scott Dziak
- Applicant Address: US CA Milpitas
- Assignee: LSI Corporation
- Current Assignee: LSI Corporation
- Current Assignee Address: US CA Milpitas
- Agency: Hamilton DeSanctis & Cha
- Main IPC: G11B27/36
- IPC: G11B27/36

Abstract:
The present inventions are related to apparatuses and methods for detecting and classifying media defects. For example, an apparatus for classifying a media defect is disclosed including a DFT circuit operable to yield real and imaginary components of a signal derived from data read from a storage medium, a calculation circuit operable to calculate an amplitude and a phase of the signal based on the real and imaginary components, and a classifier operable to detect the media defect based on the amplitude and to classify the media defect based on the phase.
Public/Granted literature
- US20130335851A1 Media Defect Classification Public/Granted day:2013-12-19
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