Invention Grant
- Patent Title: Closed loop feedback for electronic beam alignment
- Patent Title (中): 电子束对准的闭环反馈
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Application No.: US12690530Application Date: 2010-01-20
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Publication No.: US08675141B2Publication Date: 2014-03-18
- Inventor: Joshua O. Miller
- Applicant: Joshua O. Miller
- Applicant Address: US WA Redmond
- Assignee: Microvision, Inc.
- Current Assignee: Microvision, Inc.
- Current Assignee Address: US WA Redmond
- Agent Kevin D. Wills
- Main IPC: H04N3/22
- IPC: H04N3/22 ; H04N3/26

Abstract:
Briefly, in accordance with one or more embodiments, a closed loop feedback system for electronic beam alignment in a scanned beam display comprises a light source to emit one or more light beams, a controller to provide a control signal to drive the light source, a scanning platform to receive the one or more light beams and scan the light beams in a scanning pattern to project an image, and an alignment detector to provide a feedback signal indicative of beam position information of the light beams in the far field to the controller. An optic may be disposed in the beam path to magnify and/or to transform beam position information into the far field for the one or more alignment detectors. The controller adjusts the control signal in response to the feedback signal received from the alignment detector to maintain alignment of the light beams in a far field.
Public/Granted literature
- US20110176068A1 Closed Loop Feedback for Electronic Beam Alignment Public/Granted day:2011-07-21
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