A scan-flip flop circuit includes an input stage for providing a data signal to a data node, wherein the input stage includes first and second stacks of transistors devices coupled to the data node. The first stack receives a data input signal during a normal operation mode for input to the data node, and the second stack receiving a scan input signal during a scan test mode for input to the data node. The scan flip-flop circuit also includes a master latch coupled directly to the data node for latching the data signal from the input stage and outputting the data signal; a slave latch coupled to an output of the master latch for latching the output from the master latch and outputting the output; and a scan and clock control logic module. The scan and clock control logic module controls the first stack to input the data input signal to the data node during normal operation mode.