Invention Grant
- Patent Title: Active calibration for high-speed memory devices
- Patent Title (中): 高速存储设备的主动校准
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Application No.: US13130515Application Date: 2009-12-29
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Publication No.: US08667347B2Publication Date: 2014-03-04
- Inventor: Jared L. Zerbe , Frederick A. Ware , Brian S. Leibowitz
- Applicant: Jared L. Zerbe , Frederick A. Ware , Brian S. Leibowitz
- Applicant Address: US CA Sunnyvale
- Assignee: Rambus Inc.
- Current Assignee: Rambus Inc.
- Current Assignee Address: US CA Sunnyvale
- Agency: Mahamedi Paradice Kreisman LLP
- International Application: PCT/US2009/069759 WO 20091229
- International Announcement: WO2010/078383 WO 20100708
- Main IPC: G11C29/00
- IPC: G11C29/00

Abstract:
A system for calibrating timing for write operations between a memory controller and a memory device. During operation, the system identifies a time gap required to transition from writing data from the memory controller to the memory device to reading data from the memory device to the memory controller. The system then transmits a test data pattern to the memory device within the time gap. The system subsequently uses the received test data pattern to calibrate a phase relationship between a received timing signal and data transmitted from the memory controller to the memory device during write operations.
Public/Granted literature
- US20110239063A1 ACTIVE CALIBRATION FOR HIGH-SPEED MEMORY DEVICES Public/Granted day:2011-09-29
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