Invention Grant
US08667347B2 Active calibration for high-speed memory devices 有权
高速存储设备的主动校准

Active calibration for high-speed memory devices
Abstract:
A system for calibrating timing for write operations between a memory controller and a memory device. During operation, the system identifies a time gap required to transition from writing data from the memory controller to the memory device to reading data from the memory device to the memory controller. The system then transmits a test data pattern to the memory device within the time gap. The system subsequently uses the received test data pattern to calibrate a phase relationship between a received timing signal and data transmitted from the memory controller to the memory device during write operations.
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