Invention Grant
- Patent Title: High speed error detector for fading propagation channels
- Patent Title (中): 用于衰落传播通道的高速误差检测器
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Application No.: US13045857Application Date: 2011-03-11
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Publication No.: US08667343B2Publication Date: 2014-03-04
- Inventor: Joseph E. Sluz , James L. Riggins, II , Juan C. Juarez , David W. Young
- Applicant: Joseph E. Sluz , James L. Riggins, II , Juan C. Juarez , David W. Young
- Applicant Address: US MD Baltimore
- Assignee: The Johns Hopkins University
- Current Assignee: The Johns Hopkins University
- Current Assignee Address: US MD Baltimore
- Agent Noah J. Hayward
- Main IPC: G06F11/00
- IPC: G06F11/00
Abstract:
A customized bit error rate tester that characterizes data transmission through a free space optical channel that overcomes the limitations of commercial based bit error rate testers by providing visibility into packet based channel capacity by measuring bit-level statistics not dominated by fades. In this manner, fade characteristics can be measured and a relationship between fade time and data packet lengths can be developed. Further, analog outputs provide visual real-time data link statistics.
Public/Granted literature
- US20120063773A1 High Speed Error Detector for Fading Propagation Channels Public/Granted day:2012-03-15
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