Invention Grant
- Patent Title: Competition testing device
- Patent Title (中): 竞赛测试装置
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Application No.: US13208506Application Date: 2011-08-12
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Publication No.: US08667233B2Publication Date: 2014-03-04
- Inventor: Yasushi Asano
- Applicant: Yasushi Asano
- Applicant Address: JP Kawasaki
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Current Assignee Address: JP Kawasaki
- Agency: Fujitsu Patent Center
- Priority: JP2010-182152 20100817
- Main IPC: G06F12/00
- IPC: G06F12/00

Abstract:
A competition testing apparatus for testing an access competition of an arithmetic unit includes a memory that stores a program, a first processor that executes the program by accessing the memory, a second processor that executes the program by accessing the memory, and an arbitration unit that arbitrates accessing the first processor and the second processor and reports a result of the arbitration upon the first processor and the second processor accessing the same address space in the memory, wherein the memory stores a odd number of programs, further comprises a controller that controls the first processor to process the plurality of test programs stored in the storage in predetermined order, and controls the second processor to process the plurality of test programs stored in the storage in order reverse to the predetermined order, and a recording unit that records the result of arbitration performed using the arbitrator.
Public/Granted literature
- US20120210101A1 COMPETITION TESTING DEVICE Public/Granted day:2012-08-16
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