Invention Grant
- Patent Title: Heterogeneous multi-core integrated circuit and method for debugging same
- Patent Title (中): 异构多核集成电路及其调试方法
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Application No.: US13269574Application Date: 2011-10-08
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Publication No.: US08666690B2Publication Date: 2014-03-04
- Inventor: Amar Nath Deogharia , Robert N. Ehrlich , Robert A. McGowan
- Applicant: Amar Nath Deogharia , Robert N. Ehrlich , Robert A. McGowan
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Agent Charles Bergere
- Main IPC: G01R27/28
- IPC: G01R27/28

Abstract:
A heterogeneous multi-core integrated circuit includes first and second sets of processor cores and corresponding first and second test access ports (TAPs). The first and second TAPs are connected to corresponding first and second debug ports by way of corresponding first and second TAP controllers. A debug control circuit is connected between the first and second TAP controllers and the first and second debug ports. Based on external configuration signals, the debug control circuit configures the connections between the first and second TAP controllers and the first and second debug ports according to predetermined configuration modes, which allows flexibility in debugging the heterogeneous multi-core integrated circuit.
Public/Granted literature
- US20130090887A1 HETEROGENEOUS MULTI-CORE INTEGRATED CIRCUIT AND METHOD FOR DEBUGGING SAME Public/Granted day:2013-04-11
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