Invention Grant
US08666202B2 System and method for measuring properties of a thin film coated glass
有权
用于测量薄膜涂层玻璃的性能的系统和方法
- Patent Title: System and method for measuring properties of a thin film coated glass
- Patent Title (中): 用于测量薄膜涂层玻璃的性能的系统和方法
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Application No.: US13400357Application Date: 2012-02-20
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Publication No.: US08666202B2Publication Date: 2014-03-04
- Inventor: Jordan B. Lagerman , Keith J. Burrows , Kyle R. Thering
- Applicant: Jordan B. Lagerman , Keith J. Burrows , Kyle R. Thering
- Applicant Address: US MN Eden Prairie
- Assignee: Cardinal IG Company
- Current Assignee: Cardinal IG Company
- Current Assignee Address: US MN Eden Prairie
- Agency: Fredrikson & Byron, P.A.
- Main IPC: G02B6/26
- IPC: G02B6/26 ; G02B6/42 ; G01N21/86 ; G01V8/00 ; G01N21/88

Abstract:
A system for measuring properties of a thin film coated glass having a light source, a spectrometer, at least one pair of probes, a first optical fiber switch and a second optical fiber switch. The pair of probes includes a first probe located on one side of a glass sheet and a second probe located on the opposite side of the glass sheet, directly across from the first probe. The first and second optical fiber switches are adapted to couple either probe to the light source and/or the spectrometer. Because the design of the system is optically symmetrical, calibration may be performed without the use of a reference material such as a tile or mirror.
Public/Granted literature
- US20130215413A1 SYSTEM AND METHOD FOR MEASURING PROPERTIES OF A THIN FILM COATED GLASS Public/Granted day:2013-08-22
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