Invention Grant
US08666116B2 Method and system for obtaining a first signal for analysis to characterize at least one periodic component thereof
有权
用于获得用于分析以表征其至少一个周期分量的第一信号的方法和系统
- Patent Title: Method and system for obtaining a first signal for analysis to characterize at least one periodic component thereof
- Patent Title (中): 用于获得用于分析以表征其至少一个周期分量的第一信号的方法和系统
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Application No.: US13500000Application Date: 2010-09-29
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Publication No.: US08666116B2Publication Date: 2014-03-04
- Inventor: Ihor Olehovych Kirenko , Vincent Jeanne , Gerard De Haan , Adriaan Johan Van Leest
- Applicant: Ihor Olehovych Kirenko , Vincent Jeanne , Gerard De Haan , Adriaan Johan Van Leest
- Applicant Address: NL Eindhoven
- Assignee: Koninklijke Philips N.V.
- Current Assignee: Koninklijke Philips N.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP09172337 20091006
- International Application: PCT/IB2010/054396 WO 20100929
- International Announcement: WO2011/042839 WO 20110414
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
A method of facilitating obtaining a first signal, for analysis to characterize at least one periodic component, includes obtaining two second signals representative of intensities of electromagnetic radiation. The first signal is at least derivable from an output signal obtainable by applying a transformation to the second signals such that any value of the output signal is based on values from each respective second signal at corresponding points in time. The method further includes obtaining a value of a variable determining influences of components of respective second signals on the output signal when the signals corresponding to the second signals are captured and the transformation is applied, by (i) analyzing the first, second and/or the output signals to select a value of a parameter corresponding to a respective one of the variables; or (ii) calculating values of at least one time-varying factor corresponding to a respective one of the variables.
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