Invention Grant
- Patent Title: Memory edge cell
- Patent Title (中): 内存边缘单元格
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Application No.: US13924176Application Date: 2013-06-21
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Publication No.: US08665654B2Publication Date: 2014-03-04
- Inventor: Hong-Chen Cheng , Ming-Yi Lee , Kuo-Hua Pan , Jung-Hsuan Chen , Li-Chun Tien , Cheng Hung Lee , Hung-Jen Liao
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW
- Agency: Lowe Hauptman & Ham, LLP
- Main IPC: G11C7/10
- IPC: G11C7/10

Abstract:
A column of a memory includes a first edge cell and at least one memory cell. The first edge cell is located at a first edge of the column and includes a first edge cell reference node and a second edge cell reference node. Each of the at least one memory cells includes a first memory reference node. The first edge cell reference node is coupled to respective first memory reference nodes of the at least one memory cell. The second edge cell reference node serves as second memory reference nodes of the at least one memory cell. Front-end layers of the first edge cell are the same as front-end layers of a memory cell of the at least one memory cell.
Public/Granted literature
- US20130286708A1 MEMORY EDGE CELL Public/Granted day:2013-10-31
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