Invention Grant
US08665638B2 MRAM sensing with magnetically annealed reference cell 有权
具有磁退火参考电池的MRAM感测

  • Patent Title: MRAM sensing with magnetically annealed reference cell
  • Patent Title (中): 具有磁退火参考电池的MRAM感测
  • Application No.: US13179631
    Application Date: 2011-07-11
  • Publication No.: US08665638B2
    Publication Date: 2014-03-04
  • Inventor: Hari M. RaoXiaochun Zhu
  • Applicant: Hari M. RaoXiaochun Zhu
  • Applicant Address: US CA San Diego
  • Assignee: QUALCOMM Incorporated
  • Current Assignee: QUALCOMM Incorporated
  • Current Assignee Address: US CA San Diego
  • Agent Sam Talpalatsky; Nicholas J. Pauley; Joseph Agusta
  • Main IPC: G11C11/00
  • IPC: G11C11/00
MRAM sensing with magnetically annealed reference cell
Abstract:
Systems and method for reading/sensing data stored in magnetoresistive random access memory (MRAM) cells using magnetically annealed reference cells. A MRAM includes a reference circuit comprising at least one magnetic storage cell, wherein each magnetic storage cell in the MRAM is programmed to the same state. The reference circuit includes a load element coupled to the magnetic storage cell, wherein the load element is configured to establish a reference voltage during a read operation.
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