Invention Grant
- Patent Title: MRAM sensing with magnetically annealed reference cell
- Patent Title (中): 具有磁退火参考电池的MRAM感测
-
Application No.: US13179631Application Date: 2011-07-11
-
Publication No.: US08665638B2Publication Date: 2014-03-04
- Inventor: Hari M. Rao , Xiaochun Zhu
- Applicant: Hari M. Rao , Xiaochun Zhu
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM Incorporated
- Current Assignee: QUALCOMM Incorporated
- Current Assignee Address: US CA San Diego
- Agent Sam Talpalatsky; Nicholas J. Pauley; Joseph Agusta
- Main IPC: G11C11/00
- IPC: G11C11/00

Abstract:
Systems and method for reading/sensing data stored in magnetoresistive random access memory (MRAM) cells using magnetically annealed reference cells. A MRAM includes a reference circuit comprising at least one magnetic storage cell, wherein each magnetic storage cell in the MRAM is programmed to the same state. The reference circuit includes a load element coupled to the magnetic storage cell, wherein the load element is configured to establish a reference voltage during a read operation.
Public/Granted literature
- US20130016553A1 MRAM Sensing with Magnetically Annealed Reference Cell Public/Granted day:2013-01-17
Information query