Invention Grant
- Patent Title: Enhanced sensitivity interferometric sensors
- Patent Title (中): 增强灵敏度干涉传感器
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Application No.: US13055464Application Date: 2009-07-23
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Publication No.: US08665447B2Publication Date: 2014-03-04
- Inventor: Ronen Levy , Shlomo Ruschin
- Applicant: Ronen Levy , Shlomo Ruschin
- Applicant Address: IL Tel Aviv
- Assignee: Ramot at Tel Aviv University Ltd.
- Current Assignee: Ramot at Tel Aviv University Ltd.
- Current Assignee Address: IL Tel Aviv
- Agent Mark M. Friedman
- International Application: PCT/IB2009/053200 WO 20090723
- International Announcement: WO2010/010527 WO 20100128
- Main IPC: G01B9/02
- IPC: G01B9/02

Abstract:
A sensor (10) and corresponding method for sensing variations in a parameter employ an optical device (12) defining two optical paths (14, 16) differentially affected by a variation in the parameter so as to change the differential phase between the two paths. This differential phase is monitored by a spectral interrogation arrangement (18) including a radiation input device (20) for delivering to the optical device (12) incident radiation at a plurality of wavelengths, and a reading arrangement (22) for measuring the interference-modulated optical output. The optical device (12) is configured so that the two optical paths have differing dispersion properties such that a difference between the phase accumulated by light propagating along the optical paths as a function of wavelength exhibits a maximum or minimum at some wavelength designated λcritical. The plurality of wavelengths employed by the spectral interrogation arrangement span a range of wavelengths including, or adjacent to, λcritical.
Public/Granted literature
- US20110188047A1 ENHANCED SENSITIVITY INTERFEROMETRIC SENSORS Public/Granted day:2011-08-04
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