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US08665447B2 Enhanced sensitivity interferometric sensors 失效
增强灵敏度干涉传感器

Enhanced sensitivity interferometric sensors
Abstract:
A sensor (10) and corresponding method for sensing variations in a parameter employ an optical device (12) defining two optical paths (14, 16) differentially affected by a variation in the parameter so as to change the differential phase between the two paths. This differential phase is monitored by a spectral interrogation arrangement (18) including a radiation input device (20) for delivering to the optical device (12) incident radiation at a plurality of wavelengths, and a reading arrangement (22) for measuring the interference-modulated optical output. The optical device (12) is configured so that the two optical paths have differing dispersion properties such that a difference between the phase accumulated by light propagating along the optical paths as a function of wavelength exhibits a maximum or minimum at some wavelength designated λcritical. The plurality of wavelengths employed by the spectral interrogation arrangement span a range of wavelengths including, or adjacent to, λcritical.
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