Invention Grant
- Patent Title: Method of determining implicit hidden features of phenomena which can be represented by a point distribution in a space
- Patent Title (中): 确定可由空间中的点分布表示的现象的隐式隐藏特征的方法
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Application No.: US12969673Application Date: 2010-12-16
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Publication No.: US08665270B2Publication Date: 2014-03-04
- Inventor: Paolo Massimo Buscema
- Applicant: Paolo Massimo Buscema
- Applicant Address: IT Rome IT Rome
- Assignee: CSI Ricerca & Ambiente SRL,Semeion Centro Ricerche
- Current Assignee: CSI Ricerca & Ambiente SRL,Semeion Centro Ricerche
- Current Assignee Address: IT Rome IT Rome
- Agency: Themis Law
- Main IPC: G06T15/40
- IPC: G06T15/40

Abstract:
A method of determining implicit hidden features of phenomena, representable by a point distribution in a space, includes the following steps: defining a set of first parameters describing effects of a phenomenon such as an event or process; defining a n-dimensional space, wherein the first parameters are represented by entity points; determining, as a function of measured values of the first parameters, additional geometrical points in the n-dimensional space, which are expected to provide additional characteristic parameters describing the phenomenon or additional locations where the phenomenon will produce its effects; adding the additional parameters or points, in recurrent sequence, to the first parameters or points, to define at each iterative step a shorter minimum spanning tree than at the preceding step; and displaying or printing the n-dimensional space, wherein the additional characteristic parameters or points are shown together with the first parameters and the geometrical point.
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