Invention Grant
- Patent Title: Obtaining a calibration parameter for an antenna array
- Patent Title (中): 获取天线阵列的校准参数
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Application No.: US13788550Application Date: 2013-03-07
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Publication No.: US08665141B2Publication Date: 2014-03-04
- Inventor: Håkan Malmqvist , Leonard Rexberg
- Applicant: Telefonaktiebolaget L M Ericsson (publ)
- Applicant Address: SE Stockholm
- Assignee: Telefonaktiebolaget LM Ericsson (publ)
- Current Assignee: Telefonaktiebolaget LM Ericsson (publ)
- Current Assignee Address: SE Stockholm
- Agency: Coats & Bennett, PLLC
- Main IPC: G01S7/40
- IPC: G01S7/40

Abstract:
Embodiments herein include a method for obtaining a calibration parameter for an antenna array. The antenna array comprises a first and a second radio module with respective associated antennas, wherein both radio modules comprise a main transmitter and a connected calibration receiver or both radio modules comprise a main receiver and a connected calibration transmitter. The method comprises: injecting a first calibration signal in the first radio module and measuring a first response to the first calibration in the first radio module. This injecting and measuring is repeated for all combinations of the first and second radio modules. Finally, a numerical value is calculated using the responses; a calibration parameter is calculated based on the calculated numerical value. Embodiments herein also include a corresponding antenna array, computer program and computer program product.
Public/Granted literature
- US20130214965A1 Obtaining a Calibration Parameter for an Antenna Array Public/Granted day:2013-08-22
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