Invention Grant
US08665125B2 Electronic device and method for measuring differential non-linearity (DNL) of an SAR ADC
有权
用于测量SAR ADC的差分非线性(DNL)的电子设备和方法
- Patent Title: Electronic device and method for measuring differential non-linearity (DNL) of an SAR ADC
- Patent Title (中): 用于测量SAR ADC的差分非线性(DNL)的电子设备和方法
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Application No.: US13569310Application Date: 2012-08-08
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Publication No.: US08665125B2Publication Date: 2014-03-04
- Inventor: Michael Reinhold , Martin Allinger , Frank Ohnhaeuser
- Applicant: Michael Reinhold , Martin Allinger , Frank Ohnhaeuser
- Applicant Address: DE Freising
- Assignee: Texas Instruments Deutschland GmbH
- Current Assignee: Texas Instruments Deutschland GmbH
- Current Assignee Address: DE Freising
- Agent Alan A. R. Cooper; W. James Brady, III; Frederick J. Telecky, Jr.
- Priority: DE102011110115 20110815
- Main IPC: H03M1/10
- IPC: H03M1/10

Abstract:
The device comprises a successive approximation register, a capacitive digital-to-analog converter comprising a plurality of capacitors, the plurality of capacitors being coupled with a first side to a common node; a comparator coupled to the common node and being adapted to make bit decisions by comparing a voltage at the common node with another voltage level, and a SAR control stage for providing a digital code representing a conversion result. The device is configured to operate in a calibration mode, where the device is configured to sample a reference voltage on a first capacitor of the plurality of capacitors by coupling one side of the first capacitor to the reference voltage, to perform a regular conversion cycle with at least those capacitors of the plurality of capacitors having lower significance than the first capacitor and to provide the conversion result of the regular conversion cycle for calibrating the first capacitor.
Public/Granted literature
- US20130044015A1 ELECTRONIC DEVICE AND METHOD FOR MEASURING DNL OF AN SAR ADC Public/Granted day:2013-02-21
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