Invention Grant
US08664651B2 Switching device and method of manufacturing the same 有权
开关装置及其制造方法

  • Patent Title: Switching device and method of manufacturing the same
  • Patent Title (中): 开关装置及其制造方法
  • Application No.: US12808392
    Application Date: 2008-11-25
  • Publication No.: US08664651B2
    Publication Date: 2014-03-04
  • Inventor: Naoki Banno
  • Applicant: Naoki Banno
  • Applicant Address: JP Tokyo
  • Assignee: NEC Corporation
  • Current Assignee: NEC Corporation
  • Current Assignee Address: JP Tokyo
  • Priority: JP2007-326960 20071219
  • International Application: PCT/JP2008/071311 WO 20081125
  • International Announcement: WO2009/078251 WO 20090625
  • Main IPC: H01L29/10
  • IPC: H01L29/10
Switching device and method of manufacturing the same
Abstract:
A switching device includes a first electrode (101), a second electrode (102), and a complex oxide ion conducting layer (103) interposed between the first electrode (101) and the second electrode (102). The complex oxide ion conducting layer (103) contains at least two oxides including a metal oxide. The first electrode (101) can supply electrons to the complex oxide ion conducting layer (103). The second electrode (102) contains a metal and can supply ions of the metal to the complex oxide ion conducting layer (103).
Public/Granted literature
Information query
IPC分类:
H 电学
H01 基本电气元件
H01L 半导体器件;其他类目中不包括的电固体器件(使用半导体器件的测量入G01;一般电阻器入H01C;磁体、电感器、变压器入H01F;一般电容器入H01G;电解型器件入H01G9/00;电池组、蓄电池入H01M;波导管、谐振器或波导型线路入H01P;线路连接器、汇流器入H01R;受激发射器件入H01S;机电谐振器入H03H;扬声器、送话器、留声机拾音器或类似的声机电传感器入H04R;一般电光源入H05B;印刷电路、混合电路、电设备的外壳或结构零部件、电气元件的组件的制造入H05K;在具有特殊应用的电路中使用的半导体器件见应用相关的小类)
H01L29/00 专门适用于整流、放大、振荡或切换,并具有至少一个电位跃变势垒或表面势垒的半导体器件;具有至少一个电位跃变势垒或表面势垒,例如PN结耗尽层或载流子集结层的电容器或电阻器;半导体本体或其电极的零部件(H01L31/00至H01L47/00,H01L51/05优先;除半导体或其电极之外的零部件入H01L23/00;由在一个共用衬底内或其上形成的多个固态组件组成的器件入H01L27/00)
H01L29/02 .按其半导体本体的特征区分的
H01L29/06 ..按其形状区分的;按各半导体区域的形状、相对尺寸或配置区分的
H01L29/10 ...具有连接到1个不通有待整流、放大或切换的电流的电极上去的半导体区域的;并且这样的电极又是包含3个或更多个电极的半导体器件的组成部分的
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