Invention Grant
- Patent Title: System, apparatus, and method for simultaneous single molecule atomic force microscopy and fluorescence measurements
- Patent Title (中): 用于同时单分子原子力显微镜和荧光测量的系统，装置和方法
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Application No.: US13569927Application Date: 2012-08-08
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Publication No.: US08656510B1Publication Date: 2014-02-18
- Inventor: Sanjeevi Sivasankar , Hui Li
- Applicant: Sanjeevi Sivasankar , Hui Li
- Applicant Address: US IA Ames
- Assignee: Iowa State University Research Foundation, Inc.
- Current Assignee: Iowa State University Research Foundation, Inc.
- Current Assignee Address: US IA Ames
- Agency: McKee, Voorhees & Sease, P.L.C.
- Main IPC: G01Q30/02
- IPC: G01Q30/02
Abstract:
An apparatus, system, and method of integrating atomic force microscopy (AFM) and fluorescence microscopy (FM). One particular application is to simultaneous single molecular fluorescence with AFM force spectroscopy. Included is a methodology to align the AFM tip and a molecule or other nanoscale object with high accuracy.
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