Invention Grant
US08656232B2 Apparatus and method for testing semiconductor integrated circuits, and a non-transitory computer-readable medium having a semiconductor integrated circuit testing program
有权
用于测试半导体集成电路的装置和方法，以及具有半导体集成电路测试程序的非暂时计算机可读介质
- Patent Title: Apparatus and method for testing semiconductor integrated circuits, and a non-transitory computer-readable medium having a semiconductor integrated circuit testing program
- Patent Title (中): 用于测试半导体集成电路的装置和方法，以及具有半导体集成电路测试程序的非暂时计算机可读介质
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Application No.: US13019831Application Date: 2011-02-02
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Publication No.: US08656232B2Publication Date: 2014-02-18
- Inventor: Yusuke Tanefusa , Kenichi Gomi , Satoshi Yokoo
- Applicant: Yusuke Tanefusa , Kenichi Gomi , Satoshi Yokoo
- Applicant Address: JP Yokohama
- Assignee: Fujitsu Semiconductor Limited
- Current Assignee: Fujitsu Semiconductor Limited
- Current Assignee Address: JP Yokohama
- Agency: Arent Fox LLP
- Priority: JP2010-051120 20100308
- Main IPC: G01R31/28
- IPC: G01R31/28
Abstract:
An apparatus for testing a semiconductor integrated circuit includes a pattern data generating unit configured to generate test pattern data for testing a write operation in a memory of the semiconductor integrated circuit; and a write unit configured to write the test pattern data into a storage area of the semiconductor integrated circuit.
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