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US08655616B2 System for testing illuminating elements and method for testing illuminating elements 失效
用于测试照明元件的系统和用于测试照明元件的方法

  • Patent Title: System for testing illuminating elements and method for testing illuminating elements
  • Patent Title (中): 用于测试照明元件的系统和用于测试照明元件的方法
  • Application No.: US13163098
    Application Date: 2011-06-17
  • Publication No.: US08655616B2
    Publication Date: 2014-02-18
  • Inventor: Pei-Ming Chang
  • Applicant: Pei-Ming Chang
  • Applicant Address: TW Taipei
  • Assignee: Primax Electronics Ltd.
  • Current Assignee: Primax Electronics Ltd.
  • Current Assignee Address: TW Taipei
  • Agency: Kirton McConkie
  • Agent Evan R. Witt
  • Priority: TW100113133A 20110415
  • Main IPC: G06F19/00
  • IPC: G06F19/00
System for testing illuminating elements and method for testing illuminating elements
Abstract:
The present invention discloses a system for testing illuminating elements and a method for testing illuminating elements, wherein the method includes the following steps. Firstly, an illuminating element and an unilluminated area on a circuit board are covered respectively. A reference voltage is obtained according to a brightness of the unilluminated area and a testing voltage is obtained according to a brightness of the illuminating element being driven. Afterwards, whether the illuminating element passes a testing process or not is judged from the reference voltage and the testing voltage.
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