Invention Grant
US08655616B2 System for testing illuminating elements and method for testing illuminating elements
失效
用于测试照明元件的系统和用于测试照明元件的方法
- Patent Title: System for testing illuminating elements and method for testing illuminating elements
- Patent Title (中): 用于测试照明元件的系统和用于测试照明元件的方法
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Application No.: US13163098Application Date: 2011-06-17
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Publication No.: US08655616B2Publication Date: 2014-02-18
- Inventor: Pei-Ming Chang
- Applicant: Pei-Ming Chang
- Applicant Address: TW Taipei
- Assignee: Primax Electronics Ltd.
- Current Assignee: Primax Electronics Ltd.
- Current Assignee Address: TW Taipei
- Agency: Kirton McConkie
- Agent Evan R. Witt
- Priority: TW100113133A 20110415
- Main IPC: G06F19/00
- IPC: G06F19/00

Abstract:
The present invention discloses a system for testing illuminating elements and a method for testing illuminating elements, wherein the method includes the following steps. Firstly, an illuminating element and an unilluminated area on a circuit board are covered respectively. A reference voltage is obtained according to a brightness of the unilluminated area and a testing voltage is obtained according to a brightness of the illuminating element being driven. Afterwards, whether the illuminating element passes a testing process or not is judged from the reference voltage and the testing voltage.
Public/Granted literature
- US20120265467A1 SYSTEM FOR TESTING ILLUMINATING ELEMENTS AND METHOD FOR TESTING ILLUMINATING ELEMENTS Public/Granted day:2012-10-18
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