Invention Grant
- Patent Title: Mechanism for the measurement of DC properties of a signal path
- Patent Title (中): 用于测量信号路径的直流特性的机制
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Application No.: US13887186Application Date: 2013-05-03
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Publication No.: US08654828B2Publication Date: 2014-02-18
- Inventor: Stephen L. Dark
- Applicant: National Instruments Corporation
- Applicant Address: US TX Austin
- Assignee: National Instruments Corporation
- Current Assignee: National Instruments Corporation
- Current Assignee Address: US TX Austin
- Agency: Meyertons Hood Kivlin Kowert & Goetzel, P.C.
- Agent Jeffrey C. Hood; Mark K. Brightwell
- Main IPC: H04B3/46
- IPC: H04B3/46 ; H04B17/00 ; H04Q1/20

Abstract:
Systems and methods for measuring transmitter and/or receiver I/Q impairments are disclosed, including iterative methods for measuring transmitter I/Q impairments using shared local oscillators, iterative methods for measuring transmitter I/Q impairments using intentionally-offset local oscillators, and methods for measuring receiver I/Q impairments. Also disclosed are methods for computing I/Q impairments from a sampled complex signal, methods for computing DC properties of a signal path between the transmitter and receiver, and methods for transforming I/Q impairments through a linear system.
Public/Granted literature
- US20130243061A1 Mechanism for the Measurement of DC Properties of a Signal Path Public/Granted day:2013-09-19
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