Invention Grant
- Patent Title: Method of measuring interference
- Patent Title (中): 测量干扰的方法
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Application No.: US12921148Application Date: 2009-03-05
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Publication No.: US08644865B2Publication Date: 2014-02-04
- Inventor: Jae Hoon Chung , Hyun Soo Ko , Moon Il Lee , Bin Chul Ihm
- Applicant: Jae Hoon Chung , Hyun Soo Ko , Moon Il Lee , Bin Chul Ihm
- Applicant Address: KR Seoul
- Assignee: LG Electronics Inc.
- Current Assignee: LG Electronics Inc.
- Current Assignee Address: KR Seoul
- Agency: Lee, Hong, Degerman, Kang & Waimey
- Priority: KR10-2008-0071821 20080723
- International Application: PCT/KR2009/001099 WO 20090305
- International Announcement: WO2009/110756 WO 20090911
- Main IPC: H04B15/00
- IPC: H04B15/00 ; H04B7/00 ; H04B17/00
Abstract:
A method of measuring interference to perform efficient data communication is disclosed. A method of measuring interference of neighboring cells comprises allocating one or more first resource elements, to which pilot signals are allocated, to predetermined symbol regions included in a first resource block; allocating one or more second resource elements for measuring interference of the neighboring cells to a first symbol region of the predetermined symbol regions; and measuring interference of the neighboring cells using the one or more second resource elements.
Public/Granted literature
- US20110009137A1 METHOD OF MEASURING INTERFERENCE Public/Granted day:2011-01-13
Information query
