Invention Grant
- Patent Title: Clock and power fault detection for memory modules
- Patent Title (中): 内存模块的时钟和电源故障检测
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Application No.: US12770576Application Date: 2010-04-29
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Publication No.: US08644105B2Publication Date: 2014-02-04
- Inventor: Mike H. Amidi , Satyadev Kolli
- Applicant: Mike H. Amidi , Satyadev Kolli
- Applicant Address: US CA Newark
- Assignee: SMART Modular Technologies, Inc.
- Current Assignee: SMART Modular Technologies, Inc.
- Current Assignee Address: US CA Newark
- Agency: Ishimaru & Associates LLP
- Main IPC: G11C8/00
- IPC: G11C8/00

Abstract:
A system, method and apparatus for clock and power fault detection for a memory module is provided. In one embodiment, a system is provided. The system includes a voltage detection circuit and a clock detection circuit. The system further includes a controller coupled to the voltage detection circuit and the clock detection circuit. The system also includes a memory control state machine coupled to the controller. The system includes volatile memory coupled to the memory control state machine. The system further includes a battery and battery regulation circuitry coupled to the controller and the memory control state machine. The battery, battery regulation circuitry, volatile memory, memory control state machine, controller, clock detection circuit and voltage detection circuit are all collectively included in a unitary memory module.
Public/Granted literature
- US20100211765A1 CLOCK AND POWER FAULT DETECTION FOR MEMORY MODULES Public/Granted day:2010-08-19
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