Invention Grant
- Patent Title: Method and apparatus for the simultaneous generation and detection of optical diffraction interference pattern on a detector
- Patent Title (中): 用于同时产生和检测检测器上的光学衍射干涉图案的方法和装置
-
Application No.: US12668432Application Date: 2008-07-10
-
Publication No.: US08643846B2Publication Date: 2014-02-04
- Inventor: Thankappan Santhanakrishnan , Tatavarti Venkata Sreerama Narasimha Rao
- Applicant: Thankappan Santhanakrishnan , Tatavarti Venkata Sreerama Narasimha Rao
- Applicant Address: IN New Delhi
- Assignee: Defence Research and Development Organisation
- Current Assignee: Defence Research and Development Organisation
- Current Assignee Address: IN New Delhi
- Agency: Ladas & Parry LLP
- Priority: IN1469/DEL/2007 20070712
- International Application: PCT/IN2008/000444 WO 20080710
- International Announcement: WO2009/008010 WO 20090115
- Main IPC: G01B11/02
- IPC: G01B11/02

Abstract:
The present invention provides for a novel method and apparatus for the simultaneous generation and detection of optical diffraction interference pattern on a photo detector. The monitoring method and apparatus disclosed herein comprises of a (any) continuous wave coherent collimated beam of light (or a laser) falling on an (any) optically reflective coating on the surface of the body with inherent vibrations, or with manifest vibrations induced from another source through any medium where the said light is reflected, and then received on the surface of a (any) photo detector in such a way that the received light falls partially on the active sensing area, and partially on the outer perimeter of the active sensing area.
Public/Granted literature
Information query