Invention Grant
- Patent Title: Measurement and testing system
- Patent Title (中): 测量和测试系统
-
Application No.: US13726065Application Date: 2012-12-22
-
Publication No.: US08643669B1Publication Date: 2014-02-04
- Inventor: Todd Christopher Wilson , Necip Berme
- Applicant: Bertec Corporation
- Applicant Address: US OH Columbus
- Assignee: Bertec Corporation
- Current Assignee: Bertec Corporation
- Current Assignee Address: US OH Columbus
- Agency: The Law Office of Patrick F. O'Reilly III, LLC
- Main IPC: G09G5/00
- IPC: G09G5/00

Abstract:
A measurement and testing system includes a measurement assembly having at least one measurement device, at least one visual display device, and a data acquisition and processing device operatively coupled to the at least one measurement device of the measurement assembly and the visual display device. In one embodiment, the data acquisition and processing device is further configured to generate a timeline bar with date icons on the output screen of the visual display device. In other embodiments, the data acquisition and processing device is further configured to automatically displace a side bar menu on the output screen when a user switches from a current mode to another mode, read external files containing one or more testing routines written off-site, and/or automatically alert a system user when one or more signals from a measurement device are no longer detected and/or are corrupted.
Information query