Invention Grant
- Patent Title: Electromagnetic wave information detection apparatus and electromagnetic wave information detection method
- Patent Title (中): 电磁波信息检测装置及电磁波信息检测方法
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Application No.: US13072399Application Date: 2011-03-25
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Publication No.: US08643386B2Publication Date: 2014-02-04
- Inventor: Shinji Imai
- Applicant: Shinji Imai
- Applicant Address: JP Tokyo
- Assignee: FUJIFILM Corporation
- Current Assignee: FUJIFILM Corporation
- Current Assignee Address: JP Tokyo
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: JP2010-084375 20100331
- Main IPC: G01R27/04
- IPC: G01R27/04

Abstract:
Disclosed is an electromagnetic wave information detection apparatus, including a photoelectric converter including first and second electrode layers; a charge generation layer that generates positive and negative charges by irradiation of an electromagnetic wave; and a charge transport layer; an electric potential imparting unit that imparts electric potentials to the first and second electrode layers; a detection unit; and a control unit controlling the electric potential imparting unit and the detection unit such that the electric potentials of the first and second electrode layers are equalized during a predetermined period of time between a process of imparting detection electric potentials to the first and second electrode layers to detect information carried by an electromagnetic wave of a previous irradiation and a process of imparting the detection electric potentials to the first and second electrode layers to detect information carried by an electromagnetic wave of a subsequent irradiation.
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