Invention Grant
- Patent Title: Measurement project analyzer
- Patent Title (中): 测量项目分析仪
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Application No.: US11757674Application Date: 2007-06-04
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Publication No.: US08527964B2Publication Date: 2013-09-03
- Inventor: Alain G. Moriat , Patrick J. Christmas
- Applicant: Alain G. Moriat , Patrick J. Christmas
- Applicant Address: US TX Austin
- Assignee: National Instruments Corporation
- Current Assignee: National Instruments Corporation
- Current Assignee Address: US TX Austin
- Agency: Meyertons Hood Kivlin Kowert & Goetzel, P.C.
- Agent Jeffrey C. Hood; Mark S. Williams
- Main IPC: G06F9/44
- IPC: G06F9/44

Abstract:
System and method for creating a measurement application. User input specifying a sequence of functions implementing a measurement application is received, where the sequence of functions are executable to perform a specified task utilizing one or more hardware devices, and where the user input further specifies the hardware devices. Configuration of the measurement application is automatically analyzed according to rules specifying operation of the sequence of functions and the hardware devices. One or more errors in the measurement application are automatically determined based on the analyzing, and error information regarding the errors is displayed on a computer display, where the error information is usable to modify the measurement application to correct the one or more errors. In response to the error information, user input modifying the measurement application to correct the one or more errors may be received and/or the measurement application may be automatically modified to correct the errors.
Public/Granted literature
- US20080300697A1 Measurement Project Analyzer Public/Granted day:2008-12-04
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