Invention Grant
- Patent Title: Combining method parameter traces with other traces
- Patent Title (中): 组合方法参数跟踪与其他跟踪
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Application No.: US12631675Application Date: 2009-12-04
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Publication No.: US08527960B2Publication Date: 2013-09-03
- Inventor: Ralf Schmelter , Michael Wintergerst , Dietrich Mostowoj
- Applicant: Ralf Schmelter , Michael Wintergerst , Dietrich Mostowoj
- Applicant Address: DE Walldorf
- Assignee: SAP AG
- Current Assignee: SAP AG
- Current Assignee Address: DE Walldorf
- Agency: Fish & Richardson P.C.
- Main IPC: G06F9/44
- IPC: G06F9/44

Abstract:
Implementations of the present disclosure provide methods including executing an application, generating a method parameter trace, the method parameter trace providing one or more parameter values corresponding to one or more methods called during execution of the application, generating an event trace, the event trace identifying one or more events occurring during execution of the application, and combining the method parameter trace and the event trace to provide a profile of events occurring during each of the one or more methods based on the one or more parameter values.
Public/Granted literature
- US20110138363A1 COMBINING METHOD PARAMETER TRACES WITH OTHER TRACES Public/Granted day:2011-06-09
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