Invention Grant
US08527242B2 Methods and devices for analyzing material properties and detecting objects in scattering media
有权
用于分析材料性质和在散射介质中检测物体的方法和装置
- Patent Title: Methods and devices for analyzing material properties and detecting objects in scattering media
- Patent Title (中): 用于分析材料性质和在散射介质中检测物体的方法和装置
-
Application No.: US12865759Application Date: 2009-02-08
-
Publication No.: US08527242B2Publication Date: 2013-09-03
- Inventor: Er'el Granot , Shmuel Sternklar , Yosef Ben-Aderet
- Applicant: Er'el Granot , Shmuel Sternklar , Yosef Ben-Aderet
- Applicant Address: IL Ariel
- Assignee: Ariel—The University Company for Research and Development, Ltd.
- Current Assignee: Ariel—The University Company for Research and Development, Ltd.
- Current Assignee Address: IL Ariel
- Agency: Browdy and Neimark, PLLC
- Priority: IL189352 20080207
- International Application: PCT/IL2009/000143 WO 20090208
- International Announcement: WO2009/098694 WO 20090813
- Main IPC: G06F19/00
- IPC: G06F19/00
Abstract:
Disclosed is a method for determining an phase spectrum θ(ω) of the complex spectral transfer function H(ω) of a medium. In some embodiments, the method is applied for detecting or imaging an object screened by scattering medium or for determining a refractive index spectrum of a material.
Public/Granted literature
- US20110022328A1 Methods And Devices For Analyzing Material Properties And Detecting Objects In Scattering Media Public/Granted day:2011-01-27
Information query
