Invention Grant
- Patent Title: Programming methods for a memory device
- Patent Title (中): 存储设备的编程方法
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Application No.: US13614223Application Date: 2012-09-13
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Publication No.: US08526236B2Publication Date: 2013-09-03
- Inventor: Mason Jones
- Applicant: Mason Jones
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Leffert Jay & Polglaze, P.A.
- Main IPC: G11C16/10
- IPC: G11C16/10

Abstract:
Methods for programming, memory devices, and memory systems are disclosed. In one such method for programming, a target memory cell is partially programmed to a final target programmed state where the partial programming is verified by applying a ramped voltage having a first voltage range (e.g., where the first voltage range is selected in response to program coupling effects from memory cells adjacent to the target memory cell.) A programming operation following the partial programming operation is performed on one or more adjacent memory cells which is then followed by additional programming of the target memory cell to adjust the memory cell from the partially programmed state to the final programmed state. A ramped voltage having a second voltage range different from the first voltage range is utilized to verify the programming of the target memory cell to the final programmed state.
Public/Granted literature
- US20130010540A1 PROGRAMMING METHODS FOR A MEMORY DEVICE Public/Granted day:2013-01-10
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