A test apparatus configured to test an N-bit (N represents an integer) A/D converter is provided. A voltage generating unit outputs a 2N-valued analog voltage to the A/D converter. A capture unit captures an output code of the A/D converter for each level. A signal processing unit compares the output code captured for each level with the corresponding expected value code, corrects the value of the analog voltage for each level based upon the comparison result, and outputs the corrected analog voltage to the voltage generating unit.