Invention Grant
- Patent Title: Load testing circuit
- Patent Title (中): 负载测试电路
-
Application No.: US12126178Application Date: 2008-05-23
-
Publication No.: US08525536B2Publication Date: 2013-09-03
- Inventor: Arnold Knott
- Applicant: Arnold Knott
- Applicant Address: DE Karlsbad
- Assignee: Harman Becker Automotive Systems GmbH
- Current Assignee: Harman Becker Automotive Systems GmbH
- Current Assignee Address: DE Karlsbad
- Agency: O'Shea Getz P.C.
- Priority: EP07010276 20070523
- Main IPC: H03K5/01
- IPC: H03K5/01 ; H04R29/00 ; H03H7/38

Abstract:
A load testing circuit a circuit tests the load impedance of a load connected to an amplifier. The load impedance includes a first terminal and a second terminal, the load testing circuit comprising a signal generator providing a test signal of a defined bandwidth to the first terminal of the load impedance, an energy-storing element being connected to the second terminal of the load impedance and providing an output signal, and a measuring unit that measures the output signal or compares the output signal with a reference.
Public/Granted literature
- US20090051368A1 LOAD TESTING CIRCUIT Public/Granted day:2009-02-26
Information query
IPC分类: