Invention Grant
- Patent Title: Water quality assessment sensor, water quality assessment method for feed water using water quality assessment sensor, and operation management method for water treatment facility
- Patent Title (中): 水质评估传感器，使用水质评估传感器的给水水质评估方法和水处理设施的运行管理方法
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Application No.: US12819908Application Date: 2010-06-21
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Publication No.: US08522605B2Publication Date: 2013-09-03
- Inventor: Keiko Nakano , Shinichi Taniguchi
- Applicant: Keiko Nakano , Shinichi Taniguchi
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Crowell & Moring LLP
- Priority: JP2009-147183 20090622
- Main IPC: G01N15/06
- IPC: G01N15/06
Abstract:
The same phenomenon as the phenomenon that a component of feed water is adsorbed to the surface of the membrane is used to assess water quality. Specifically, a sensor whose surface has a thin layer made of the same material as the material of the surface of the membrane and which includes a measurement unit such as a quartz crystal sensor that measures an adsorption rate on the thin layer is used to assess an effect of the water quality of the feed water on the membrane on the basis of a change in the adsorption rate on the sensor surface.
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