Invention Grant
- Patent Title: System and method for high-performance profiling of application events
- Patent Title (中): 应用事件高性能分析的系统和方法
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Application No.: US13153630Application Date: 2011-06-06
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Publication No.: US08504674B2Publication Date: 2013-08-06
- Inventor: Jeffrey A. Vaught
- Applicant: Jeffrey A. Vaught
- Applicant Address: US NY Islandia
- Assignee: CA, Inc.
- Current Assignee: CA, Inc.
- Current Assignee Address: US NY Islandia
- Agency: Pillsbury Winthrop Shaw Pittman LLP
- Main IPC: G06F15/16
- IPC: G06F15/16

Abstract:
A system and method for high-performance profiling of web-enabled application events are provided. In one embodiment, the method includes registering a profiler as a provider to an event tracer. Information associated with an event is captured using the profiler, the event is associated with a web-enabled application. A function token is associated with the captured information, which is communicated to the event tracer.
Public/Granted literature
- US20110238812A1 SYSTEM AND METHOD FOR HIGH-PERFORMANCE PROFILING OF APPLICATION EVENTS Public/Granted day:2011-09-29
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