Invention Grant
US08503496B2 Device for judging state of semiconductor laser and method for judging state of semiconductor laser 有权
用于判断半导体激光器的状态的装置以及判断半导体激光器的状态的方法

  • Patent Title: Device for judging state of semiconductor laser and method for judging state of semiconductor laser
  • Patent Title (中): 用于判断半导体激光器的状态的装置以及判断半导体激光器的状态的方法
  • Application No.: US13094968
    Application Date: 2011-04-27
  • Publication No.: US08503496B2
    Publication Date: 2013-08-06
  • Inventor: Jun Matsui
  • Applicant: Jun Matsui
  • Applicant Address: JP Kawasaki
  • Assignee: Fujitsu Limited
  • Current Assignee: Fujitsu Limited
  • Current Assignee Address: JP Kawasaki
  • Agency: Staas & Halsey LLP
  • Priority: JP2010-155265 20100707
  • Main IPC: H01S3/00
  • IPC: H01S3/00
Device for judging state of semiconductor laser and method for judging state of semiconductor laser
Abstract:
A device includes: a providing unit that provides a driving electric current to a semiconductor laser, the electric current being superimposed a first alternating current signal having a first frequency at a low side of an operational range of the semiconductor laser and a second alternating current signal having a second frequency at a high side of the operational range; a first filter that extracts a first component corresponding to the first frequency from a voltage to be applied to the semiconductor laser; a second filter that extracts a second component corresponding to the second frequency from the voltage to be applied to the semiconductor laser; and a judge circuit that judges a state of the semiconductor laser based on a first differential resistance obtained from the result of the extracting by the first filter and a second differential resistance obtained from the result of the extracting by the second filter.
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