Invention Grant
US08503239B2 Device for controlling lock state of block in a semiconductor memory and method for controlling the same 有权
用于控制半导体存储器中的块的锁定状态的装置及其控制方法

  • Patent Title: Device for controlling lock state of block in a semiconductor memory and method for controlling the same
  • Patent Title (中): 用于控制半导体存储器中的块的锁定状态的装置及其控制方法
  • Application No.: US12980267
    Application Date: 2010-12-28
  • Publication No.: US08503239B2
    Publication Date: 2013-08-06
  • Inventor: Jung Mi TakJi Hyae Bae
  • Applicant: Jung Mi TakJi Hyae Bae
  • Applicant Address: KR Icheon
  • Assignee: Hynix Semiconductor Inc.
  • Current Assignee: Hynix Semiconductor Inc.
  • Current Assignee Address: KR Icheon
  • Priority: KR10-2010-0120049 20101129
  • Main IPC: G06F12/00
  • IPC: G06F12/00 G06F13/00
Device for controlling lock state of block in a semiconductor memory and method for controlling the same
Abstract:
A block control device for a semiconductor memory and a method for controlling the same are disclosed, which relate to a technology for controlling a block operation state of a Low Power Double-Data-Rate 2 (LPDDR2) non-volatile memory device. A block control device for use in a semiconductor memory includes a block address comparator configured to compare a first block address with a last block address, and output a same pulse or unequal pulse according to the comparison result, a block address driver configured to output a lock state control signal for driving a block address in response to the same pulse, a block address counter configured to count block addresses from the first block address to the last block address in response to the unequal pulse, and generate a block data activation pulse, and a block address register configured to store a lock state of a corresponding block in response to the lock state control signal and the block data activation pulse.
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