Invention Grant
- Patent Title: Gauge line position measuring device, program for measuring a gauge line position, and gauge line mark
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Application No.: US12379393Application Date: 2009-02-20
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Publication No.: US08502871B2Publication Date: 2013-08-06
- Inventor: Hiroshi Tsuji
- Applicant: Hiroshi Tsuji
- Applicant Address: JP Kyoto-Shi
- Assignee: Shimadzu Corporation
- Current Assignee: Shimadzu Corporation
- Current Assignee Address: JP Kyoto-Shi
- Agent Manabu Kanesaka
- Priority: JP2008-059462 20080310
- Main IPC: H04N7/18
- IPC: H04N7/18

Abstract:
A gauge line position measuring device measures a position of a gauge line provided on a test piece by a non-contact video method. The measuring device includes a gauge line mark adapted to be provided on the test piece and has the gauge line and a first continuous harmonious color density arranged line-symmetrically with respect to the gauge line, and a video camera for taking an image of the gauge line mark on the test piece and outputting gauge line mark image data. A calculation device calculates a gauge line position based on the gauge line mark image data.
Public/Granted literature
- US20090225167A1 Gauge line position measuring device, program for measuring a gauge line position, and gauge line mark Public/Granted day:2009-09-10
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