• Patent Title: Gauge line position measuring device, program for measuring a gauge line position, and gauge line mark
  • Application No.: US12379393
    Application Date: 2009-02-20
  • Publication No.: US08502871B2
    Publication Date: 2013-08-06
  • Inventor: Hiroshi Tsuji
  • Applicant: Hiroshi Tsuji
  • Applicant Address: JP Kyoto-Shi
  • Assignee: Shimadzu Corporation
  • Current Assignee: Shimadzu Corporation
  • Current Assignee Address: JP Kyoto-Shi
  • Agent Manabu Kanesaka
  • Priority: JP2008-059462 20080310
  • Main IPC: H04N7/18
  • IPC: H04N7/18
Gauge line position measuring device, program for measuring a gauge line position, and gauge line mark
Abstract:
A gauge line position measuring device measures a position of a gauge line provided on a test piece by a non-contact video method. The measuring device includes a gauge line mark adapted to be provided on the test piece and has the gauge line and a first continuous harmonious color density arranged line-symmetrically with respect to the gauge line, and a video camera for taking an image of the gauge line mark on the test piece and outputting gauge line mark image data. A calculation device calculates a gauge line position based on the gauge line mark image data.
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