Invention Grant
- Patent Title: Enhanced method for monitoring the deposition of organic materials in a papermaking process
- Patent Title (中): 用于监测造纸过程中有机材料沉积的增强方法
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Application No.: US12907478Application Date: 2010-10-19
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Publication No.: US08500957B2Publication Date: 2013-08-06
- Inventor: Sergey M. Shevchenko , Michael J. Murcia
- Applicant: Sergey M. Shevchenko , Michael J. Murcia
- Applicant Address: US IL Naperville
- Assignee: Nalco Company
- Current Assignee: Nalco Company
- Current Assignee Address: US IL Naperville
- Agency: Calfee, Halter & Griswold LLP
- Main IPC: D21H23/08
- IPC: D21H23/08

Abstract:
A method for monitoring with enhanced sensitivity of the deposition of one or more organic materials dispersed in an aqueous medium in a papermaking process which includes measuring the rate of deposition of the organic materials from the aqueous medium onto a quartz crystal microbalance having a top side contacting with the aqueous medium coated with a layer containing a material with surface energy in the range from about 34 to about 49 dynes/cm2, and a second, bottom side isolated from the aqueous medium is disclosed. Additionally, a method for measuring the effectiveness of an inhibitor that decreases the deposition of the organic materials in a papermaking process is also disclosed.
Public/Granted literature
- US20110073263A1 ENHANCED METHOD FOR MONITORING THE DEPOSITION OF ORGANIC MATERIALS IN A PAPERMAKING PROCESS Public/Granted day:2011-03-31
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