Invention Grant
- Patent Title: Resistive memory sensing methods and devices
- Patent Title (中): 电阻式记忆感测方法和装置
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Application No.: US13035193Application Date: 2011-02-25
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Publication No.: US08482955B2Publication Date: 2013-07-09
- Inventor: Adam D. Johnson
- Applicant: Adam D. Johnson
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Brooks, Cameron & Huebsch, PLLC
- Main IPC: G11C11/00
- IPC: G11C11/00

Abstract:
The present disclosure includes resistive memory sensing methods and devices. One such method includes performing a voltage based multiple pass sensing operation on a group of cells coupled to a selected conductive line of an array of resistive memory cells. The voltage based multiple pass sensing operation can include providing an indication of those cells of the group that conduct at least a threshold amount of current responsive to one of a number of different sense voltages successively applied to the selected conductive line during each of a corresponding number of the multiple passes, and for each successive pass of the multiple passes, disabling data lines corresponding to those cells determined to have conducted the threshold amount of current in association with a previous one of the multiple passes.
Public/Granted literature
- US20120218807A1 RESISTIVE MEMORY SENSING METHODS AND DEVICES Public/Granted day:2012-08-30
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