Invention Grant
- Patent Title: Method and system for optical edge measurement
- Patent Title (中): 光学边缘测量的方法和系统
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Application No.: US11665978Application Date: 2005-06-20
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Publication No.: US08482743B2Publication Date: 2013-07-09
- Inventor: Avner Segev
- Applicant: Avner Segev
- Applicant Address: IL Ramat Hasharon
- Assignee: Cognitens Ltd.
- Current Assignee: Cognitens Ltd.
- Current Assignee Address: IL Ramat Hasharon
- Agency: Vorys, Sater, Seymour and Pease LLP
- Agent Susanne M. Hopkins; William L. Klima
- International Application: PCT/IL2005/000660 WO 20050620
- International Announcement: WO2006/048857 WO 20060511
- Main IPC: G01B11/14
- IPC: G01B11/14
Abstract:
Edge data for an object are obtained by placing the object in front of a medium that has greater reflectance than the object, and both are illuminated by a light source. The contrast in image intensity obtained between the object and background enables the edges of the object to be determined.
Public/Granted literature
- US20070297665A1 Method and System for Optical Edge Measurement Public/Granted day:2007-12-27
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