Invention Grant
- Patent Title: Test method for passive device embedded printed circuit board
- Patent Title (中): 无源器件嵌入式印刷电路板的测试方法
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Application No.: US12854684Application Date: 2010-08-11
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Publication No.: US08482310B2Publication Date: 2013-07-09
- Inventor: Hyun-Ho Kim , Won-Geun Jung , Yul-Kyo Chung
- Applicant: Hyun-Ho Kim , Won-Geun Jung , Yul-Kyo Chung
- Applicant Address: KR Gyunggi-Do
- Assignee: Samsung Electro-Mechanics Co., Ltd.
- Current Assignee: Samsung Electro-Mechanics Co., Ltd.
- Current Assignee Address: KR Gyunggi-Do
- Agency: McDermott Will & Emery LLP
- Priority: KR10-2010-0019803 20100305
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R31/304
Abstract:
A method of testing a passive device embedded printed circuit board is disclosed. The method in accordance with an embodiment of the present invention includes: applying an AC power to a printed circuit board in which a filter including at least two of a resistor, an inductor and a capacitor is embedded; measuring a property of the filter for the applied AC power; and determining whether or not the printed circuit board is defective by comparing the measured property of the filter with a design value.
Public/Granted literature
- US20110215828A1 TEST METHOD FOR PASSIVE DEVICE EMBEDDED PRINTED CIRCUIT BOARD Public/Granted day:2011-09-08
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