Invention Grant
- Patent Title: System for calculating resistive values for microelectronics CAD
- Patent Title (中): 用于计算微电子CAD电阻值的系统
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Application No.: US12497394Application Date: 2009-07-02
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Publication No.: US08478553B2Publication Date: 2013-07-02
- Inventor: Francois Charlet , Mathias Silvant
- Applicant: Francois Charlet , Mathias Silvant
- Applicant Address: FR Voiron
- Assignee: Edxact
- Current Assignee: Edxact
- Current Assignee Address: FR Voiron
- Agency: Nixon Peabody LLP
- Priority: FR0854580 20080704
- Main IPC: G01R27/00
- IPC: G01R27/00 ; G01R31/14

Abstract:
A method for calculating resistive values of an electronic circuit represented in the form of masks and connections includes defining the circuit in the form of a first list of electrical components and connections between them, identifying circuit entry and exit ports, selecting part of the resistive components of the circuit alone, producing a matrix of resistances of the resistive components alone selected in the previous step, and calculating equivalent resistances.
Public/Granted literature
- US20100004886A1 SYSTEM FOR CALCULATING RESISTIVE VALUES FOR MICROELECTRONICS CAD Public/Granted day:2010-01-07
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