Invention Grant
- Patent Title: Identification of aberrant microarray features
- Patent Title (中): 识别异常微阵列特征
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Application No.: US13152602Application Date: 2011-06-03
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Publication No.: US08478545B2Publication Date: 2013-07-02
- Inventor: Paul Kenneth Wolber , Robert Page
- Applicant: Paul Kenneth Wolber , Robert Page
- Applicant Address: US CA Santa Clara
- Assignee: Agilent Technologies, Inc.
- Current Assignee: Agilent Technologies, Inc.
- Current Assignee Address: US CA Santa Clara
- Main IPC: G06F19/00
- IPC: G06F19/00 ; G11C17/00 ; C12Q1/68

Abstract:
Described herein is a method for identifying an aberrant feature on a nucleic acid array. In general terms, the method comprises: a) obtaining a log transformed normalized value indicating the amount of hybridization of a test sample to a first feature on the nucleic acid array; b) calculating a z-score for the first feature using: the log transformed normalized value; and the distribution of reference log transformed normalized values that indicate the amount of hybridization of control samples to the same feature on a plurality of reference arrays; and c) identifying the test feature as aberrant if it has a z-score that is above or below a defined threshold.
Public/Granted literature
- US20120310537A1 IDENTIFICATION OF ABERRANT MICROARRAY FEATURES Public/Granted day:2012-12-06
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