Invention Grant
- Patent Title: Image inspection apparatus and method
- Patent Title (中): 图像检查装置及方法
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Application No.: US11734324Application Date: 2007-04-12
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Publication No.: US08478033B2Publication Date: 2013-07-02
- Inventor: Jin Seo Kim , Maeng Sub Cho , Bon Ki Koo
- Applicant: Jin Seo Kim , Maeng Sub Cho , Bon Ki Koo
- Applicant Address: KR Dae jeon
- Assignee: Electronics and Telecommunications Research Institute
- Current Assignee: Electronics and Telecommunications Research Institute
- Current Assignee Address: KR Dae jeon
- Agency: Ladas & Parry LLP
- Priority: KR10-2006-0113237 20061116
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
An image inspection apparatus determines whether a test image is a copy of an original image. The image inspection apparatus includes an image group generation unit that determines one or more types of image transform, and transforms the original image according to the determined types of image transform to generate an original image group; a spatial color difference computing unit that transforms a color space of the generated original image group, and calculates first spatial color differences between the original image and images in the original image group to provide color difference data; an image inspection unit that receives the test image and the original image group to calculate second spatial color differences between the test image and the images in the original image group, and compares the second spatial color differences to the color difference data; and an inspection result output unit that outputs the comparison result.
Public/Granted literature
- US20080118145A1 IMAGE INSPECTION APPARATUS AND METHOD Public/Granted day:2008-05-22
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