Invention Grant
- Patent Title: X-ray diffraction and computed tomography
- Patent Title (中): X射线衍射和计算机断层扫描
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Application No.: US12968156Application Date: 2010-12-14
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Publication No.: US08477904B2Publication Date: 2013-07-02
- Inventor: Gabriel Blaj
- Applicant: Gabriel Blaj
- Applicant Address: NL Almelo
- Assignee: PANalytical B.V.
- Current Assignee: PANalytical B.V.
- Current Assignee Address: NL Almelo
- Agency: Leason Ellis LLP
- Priority: EP10153742 20100216
- Main IPC: G01N23/207
- IPC: G01N23/207
Abstract:
An imaging system combines CT and XRD measurements, both measuring the XRD diffraction and the absorption as a function of energy. A goniometer 2, source 4 and two dimensional detector 10 may be used. Embodiments use relatively soft X-rays in the 5-25 keV range. An integrated mounting unit to mount the sample 8 close to detector 10 is also described.
Public/Granted literature
- US20110200164A1 X-RAY DIFFRACTION AND COMPUTED TOMOGRAPHY Public/Granted day:2011-08-18
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