Invention Grant
US08477539B2 Non-volatile memory cell and methods for programming, erasing and reading thereof
有权
非易失性存储单元及其编程,擦除和读取的方法
- Patent Title: Non-volatile memory cell and methods for programming, erasing and reading thereof
- Patent Title (中): 非易失性存储单元及其编程,擦除和读取的方法
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Application No.: US13183937Application Date: 2011-07-15
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Publication No.: US08477539B2Publication Date: 2013-07-02
- Inventor: Chia-Chuan Chang , Wei-Sung Chen , Chung-Ho Wu
- Applicant: Chia-Chuan Chang , Wei-Sung Chen , Chung-Ho Wu
- Applicant Address: TW Hsinchu
- Assignee: Vangaurd International Semiconductor Corporation
- Current Assignee: Vangaurd International Semiconductor Corporation
- Current Assignee Address: TW Hsinchu
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Main IPC: G11C16/04
- IPC: G11C16/04

Abstract:
A non-volatile memory cell and methods for programming, erasing and reading thereof are provided. A non-volatile memory cell includes a substrate having a first conductive type. A first transistor, a second transistor and a select transistor having a second conductive type are disposed in the substrate, wherein a first gate of the first transistor is coupled to a second gate of the second transistor. A source region of the first transistor is coupled to a bit line. A drain region of the second transistor and a gate of the select transistor are coupled to a select gate line. A drain region of the first transistor is coupled to a source region of the select transistor. A drain region of the select transistor is coupled to a select line.
Public/Granted literature
- US20130016567A1 NON-VOLTOLE MEMORY CELL AND METHODS FOR PROGRAMMING, ERASING AND READING THEREOF Public/Granted day:2013-01-17
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