Invention Grant
US08476917B2 Quiescent current (IDDQ) indication and testing apparatus and methods
有权
静态电流(IDDQ)指示和测试仪器及方法
- Patent Title: Quiescent current (IDDQ) indication and testing apparatus and methods
- Patent Title (中): 静态电流(IDDQ)指示和测试仪器及方法
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Application No.: US12696257Application Date: 2010-01-29
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Publication No.: US08476917B2Publication Date: 2013-07-02
- Inventor: Nicolas A. Jarrige , Ibrahim Shihadeh Kandah
- Applicant: Nicolas A. Jarrige , Ibrahim Shihadeh Kandah
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Agent Sherry W. Schumm
- Main IPC: G01R31/10
- IPC: G01R31/10

Abstract:
An embodiment of an electronic device includes a logic circuit, a switching element, and a quiescent current (IDDQ) evaluation circuit. The logic circuit is coupled to a first ground node. The switching element is coupled between the first ground node and a second ground node. The switching element is configurable in an electrically non-conductive state when the electronic device is in an IDDQ evaluation state, and in an electrically conductive state when the electronic device is not in the IDDQ evaluation state. When the electronic device is in the IDDQ evaluation state, the IDDQ evaluation circuit is configured to provide a first output signal when an IDDQ indicating voltage across the first and second ground nodes exceeds a reference voltage. Other embodiments include methods for producing an indication of IDDQ in an electronic device and methods for fabricating an electronic device with the capability of producing an IDDQ indication.
Public/Granted literature
- US20110187396A1 QUIESCENT CURRENT (IDDQ) INDICATION AND TESTING APPARATUS AND METHODS Public/Granted day:2011-08-04
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